Patrick William MULLIGAN

1911 - 1982  (71 years)

• Name	Patrick William MULLIGAN
  Birth	3 Jul 1911	Bromley Twp., Renfrew, Ontario, Canada   [1]
  Gender	Male
  Death	28 Nov 1982	Martin, , Florida, U.S.A.   [2]
  Burial	Osceola, Renfrew, Ontario, Canada
  	Address: St. Pius V Roman Catholic Cemetery Osceola, Ontario
  Person ID	I93483184	Whitewater Region Early Families
  Last Modified	20 Sep 2025

  
  

  Father	Patrick William MULLIGAN,   b. 17 Mar 1867, Bromley Twp., Renfrew, Ontario, Canada d. 31 Dec 1940, Ottawa, Carleton, Ontario, Canada (Age 73 years)
  Mother	Margaret Loretta SHEEHAN,   b. 1884   d. 11 Feb 1967, Osceola, Renfrew, Ontario, Canada (Age 83 years)
  Marriage	26 Sep 1910	Douglas, Renfrew, Ontario, Canada   [3]
  Family ID	F46726141	Group Sheet  |  Family Chart

  
  

  Family 1	Margaret Cynthia CAHILL,   b. 9 Sep 1911, Bromley Twp., Renfrew, Ontario, Canada d. 28 Jul 1939, Bromley Twp., Renfrew, Ontario, Canada (Age 27 years)
  Marriage	18 Oct 1937	Osceola, Renfrew, Ontario, Canada   [4]
  Family ID	F46792380	Group Sheet  |  Family Chart
  Last Modified	20 Sep 2025

  
  

  Family 2	Helen D. PATTERSON,   b. 1905, Bromley Twp., Renfrew, Ontario, Canada d. 1982 (Age 77 years)
  Marriage	19 Apr 1942	Cobden, Renfrew, Ontario, Canada   [5]
  Family ID	F46707072	Group Sheet  |  Family Chart
  Last Modified	20 Sep 2025

  
  

• Documents

  Patrick William MULLIGAN & Helen D. Patterson The Cobden Sun, April 23, 1942

  
  

• Sources

  [S1036437] FamilyTree.Com, '"Ontario Birth Registrations online at Ancestry.com", (Subscription www.ancestry.ca), delayed regn 501643 (Reliability: 3). [S1037060] BMD-US-Florida Death Index. [S1036508] Ancestry.com, *BMD-Catholic Church Records (Drouin Collection), 1747-1967 ", ((Ancestry.ca)), Osceola/Cobden. (Reliability: 3). [S1036422] FamilyTree.Com, "Ontario Marriage Registrations online at Ancestry.com", (subscription www.ancestry.ca), 022036 (Reliability: 3). [S1036429] Newspaper-CA-ON-The Cobden Sun, (Weekly Publication), The Cobden Sun, April 23, 1942 (Reliability: 3).